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    626 [Electron Microscope] ±³À°¹®ÀÇ À̽ÂÀç 16.08.30 398
    625   [Electron Microscope] ±³À°¹®ÀÇ ÇѰ漮 16.08.30 488
    624 [Electron Microscope] ±³À°¹®ÀÇ Á¶ÈñÀ± 16.08.11 480
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    622 [Microanalysis System] x-ray mapping µµÁß ¿¡·¯ ¹ß»ý ¹Úâ±Ù 16.08.01 1,394
    621 [Electron Microscope] Cressington 108 sputter ¹®ÀÇ ±èÁÖ¼º 16.07.23 274
    620 [Electron Microscope] FE-SEM ±³À°¹®ÀÇ ¹Úµ¿±Ô 16.07.21 181
    619   [Electron Microscope] FE-SEM ±³À°¹®ÀÇ ÇѰ漮 16.07.22 308
    618 [Analysis Instruments] EDS ¹®ÀÇ ¿À¼º±Ô 16.07.07 132
    617   [Analysis Instruments] EDS ¹®ÀÇ ¾ç°æÈ­ 16.07.07 805
    616 [Electron Microscope] EDS ºÐ¼® °á°ú C °ËÃ⠱輺Çå 16.06.20 132
    615   [Electron Microscope] EDS ºÐ¼® °á°ú C °ËÃâ ¾ç°æÈ­ 16.06.21 1,740
    614 [Electron Microscope] JEOL JSM-7500F ¸Å´º¾ó ¿äû (1) ±èÅÂÇö 16.06.16 118
    613 [Electron Microscope] sem ±³À°¹®ÀÇ (2) À̹®¶ô 16.06.15 121
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    611 [Electron Microscope] ±³À°¹®ÀÇ ¹Ú»ó¹Ì 16.04.25 131
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    609 [Electron Microscope] FE-SEM ±³À° °ü·ÃÇØ¼­ ¹®ÀÇ µå¸³´Ï´Ù. Àº¿µ¹« 16.04.01 119
    608   [Electron Microscope] FE-SEM ±³À° °ü·ÃÇØ¼­ ¹®ÀÇ µå¸³´Ï´Ù. ÇѰ漮 16.04.01 164
    607 [Electron Microscope] sem ±³À° ¹®ÀÇ µå¸³´Ï´Ù ±èÈÆ 16.03.30 89
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