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JEOL Korea News


  • [¿öÅ©¼¥] ¼­¿ï´ëÇб³±âÃÊ°úÇаøµ¿±â±â¿ø ÃÖ÷´ÜTEM °³¼Ò½Ä ¹× ¿öÅ©¼¥ ÀÏÁ¤
    ¿µ¾÷º»ºÎ 2015.07.01


    ÷ºÎ ÆÄÀÏ : (Electron Microscope Analysis Workshop.pdf)

    ÷ºÎ ÆÄÀÏ : (EM Analysis Workshop ÇÁ·Î±×·¥ÀÏÁ¤.pdf)

     

     

    ¾È³çÇϽʴϱî? Áö¿ÃÄÚ¸®¾ÆÀÔ´Ï´Ù.  

     

    ¼­¿ï´ëÇб³ ±âÃÊ°úÇаøµ¿±â±â¿ø¿¡¼­ ÃÖ÷´Ü Åõ°úÀüÀÚÇö¹Ì°æ(Cs-TEM/STEM) °³¼Ò½Ä(7¿ù 15ÀÏ)°ú ´õºÒ¾î ÀüÀÚÇö¹Ì°æÀÇ ÇöÀç¿Í ¹Ì·¡¸¦ ¼Ò°³ÇÏ°í, °ü·Ã ºÐ¾ß ¿¬±¸ÀÚµéÀÇ ³íÀǸ¦ È°¼ºÈ­Çϱâ À§ÇÏ¿© ÀüÀÚÇö¹Ì°æ ºÐ¾ßÀÇ ±¹,³»¿Ü ¼®ÇеéÀ» ÃÊûÇÏ¿© Electron Microscope Analysis WorkshopÀ» ¾Æ·¡¿Í °°ÀÌ °³ÃÖÇÏ°íÀÚ ÇÏ¿À´Ï °ü½ÉÀÖ´Â ºÐµéÀÇ ¸¹Àº Âü¿© ¹Ù¶ø´Ï´Ù. °¨»çÇÕ´Ï´Ù.


    Çà»ç¹®ÀÇ : ½Å´ÙÀº 02-880-5431

    ȨÆäÀÌÁö ¿¹¾à : http://irf.snu.ac.kr 


    Çà»ç¸í : Electron Microscope Analysis Workshop

    ÀÏ   ½Ã : 2015. 7. 16.(¸ñ), 7. 17.(±Ý) 13:00 ~ 17:00

    Àå   ¼Ò : ¼­¿ï´ëÇб³ À¯Àü°øÇבּ¸¼Ò(105-2µ¿) 1Ãþ °­´ç    

    ´ë   »ó : ÀüÀÚÇö¹Ì°æ¿¡ °ü½É ÀÖ´Â ¸ðµç ºÐ

    ÇÁ·Î±×·¥ : 16ÀÏ - Keynote/Lecture on Materials Analysis using Advanced Cs-TEM/STEM

                  17ÀÏ - Lecture and Panel Discussion of Future of EM Technology

     

     

     

     


     
      [ ´ÙÀ½±Û ] Semicon Korea 2016 [JEOL Booth No.1236]
      [ ÇöÀç±Û ] ¼­¿ï´ëÇб³±âÃÊ°úÇаøµ¿±â±â¿ø ÃÖ÷´ÜTEM °³¼Ò½Ä ¹× ¿öÅ©¼¥ ÀÏÁ¤
      [ ÀÌÀü±Û ] JEOL Korea Users Meeting 2015 - °¨»çÀÇ ¸»¾¸