¾È³çÇϽʴϱî? Áö¿ÃÄÚ¸®¾ÆÀÔ´Ï´Ù.
¼¿ï´ëÇб³ ±âÃÊ°úÇаøµ¿±â±â¿ø¿¡¼
ÃÖ÷´Ü Åõ°úÀüÀÚÇö¹Ì°æ(Cs-TEM/STEM) °³¼Ò½Ä(7¿ù 15ÀÏ)°ú ´õºÒ¾î ÀüÀÚÇö¹Ì°æÀÇ ÇöÀç¿Í ¹Ì·¡¸¦ ¼Ò°³ÇÏ°í, °ü·Ã ºÐ¾ß ¿¬±¸ÀÚµéÀÇ ³íÀǸ¦ È°¼ºÈÇϱâ À§ÇÏ¿© ÀüÀÚÇö¹Ì°æ ºÐ¾ßÀÇ ±¹,³»¿Ü ¼®ÇеéÀ» ÃÊûÇÏ¿© Electron Microscope Analysis
WorkshopÀ» ¾Æ·¡¿Í °°ÀÌ °³ÃÖÇÏ°íÀÚ ÇÏ¿À´Ï °ü½ÉÀÖ´Â ºÐµéÀÇ ¸¹Àº Âü¿©
¹Ù¶ø´Ï´Ù. °¨»çÇÕ´Ï´Ù.
Çà»ç¹®ÀÇ : ½Å´ÙÀº 02-880-5431 ȨÆäÀÌÁö ¿¹¾à : http://irf.snu.ac.kr
Çà»ç¸í : Electron Microscope Analysis Workshop ÀÏ ½Ã : 2015. 7. 16.(¸ñ), 7. 17.(±Ý) 13:00 ~ 17:00 Àå ¼Ò : ¼¿ï´ëÇб³ À¯Àü°øÇבּ¸¼Ò(105-2µ¿) 1Ãþ °´ç ´ë »ó : ÀüÀÚÇö¹Ì°æ¿¡ °ü½É ÀÖ´Â ¸ðµç ºÐ ÇÁ·Î±×·¥ : 16ÀÏ - Keynote/Lecture on Materials Analysis using Advanced Cs-TEM/STEM 17ÀÏ - Lecture and Panel Discussion of Future of EM Technology
|